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W.M. Keck Center Instrumentation

 

ASYLUM CYPHER ES SCANNING PROBE MICROSCOPE:

The Cypher ES is designed for high resolution imaging and Fast Scanning of material surfaces. Two high resolution pieozoelectric scanners capable of measuring areas up to 30 µm x 30 µm with a vertical range of ~ 4 µm are available for imaging. The S-scanner can image samples in air and liquids.  The ES scanner for imaging samples in liquids or controlled gas environments has a gas perfusion cell, liquid perfusion cell, heater sample cell (ambient up to 250 deg C), cooling and heating  sample cell (0-120 deg C), and controlled environment CAFM cell. The instrument has blueDrive for photothermal excitation of the cantilever which provides a clean drive response of the cantilever for tapping mode applications in air and liquids. Sample size is limited to ~ 1 x 1 inch mounted on 15 mm magnetic steel platens. This instrument is in an acoustic and air temperature controlled housing.  Quantitative probe calibration is available on this instrument.  Imaging Modes: Tapping Mode, Contact Mode, Force Spectroscopy, Fast Scanning Tapping Mode, Phase Imaging, Quantitative Nanomechanical Measurements, Scanning Kelvin Probe, CAFM (ORCA and dual gain ORCA), Force Modulation, blueDrive photothermal cantilever excitation, and Imaging in Liquids, controlled gas environments and controlled temperature. 

 


BRUKER-NANO MULTIMODE 8 SCANNING PROBE MICROSCOPE:

The Multimode 8 from Bruker Nano is designed for high resolution imaging of material surfaces. A J-pieozoelectric scanner capable of measuring areas up to 120 µm x 120 µm with a vertical range of ~ 5 µm is available for use. Sample size is limited to ~ 1 cm x 1 cm mounted on 10 mm or 12 mm magnetic steel platens. This instrument is on a vibration isolation table.  Quantitative probe calibration is available on this instrument. Imaging Modes: PeakForce Tapping Mode, PeakForce Tapping Mode with ScanAsyst, Force Spectroscopy, Tapping Mode, Contact Mode, Phase Imaging, Quantitative Nanomechanical Measurements, Scanning Kelvin Probe, Conductive Probe (CAFM or TUNA), Force Modulation, Scanning Tunneling Microscopy, and Imaging in Liquids.

 


3I SPINNING DISK MICROSCOPE:

 

The Spinning Disk Confocal on an inverted microscope base with DIC, transmitted light, and epi-Fluorescence.  The system is equipped with two fluorescence laser excitation sources at 488 nm and 561 nm.  The detector is a Photometrics Evolve CCD detector with optional Dual View attachment. Definite Focus is available for maintaining focus during timelapse experiments.  A 150 um piezoelectric Z stage and Eppendorf Transferman micromanipulator are mounted on the system.  A Plan-Neofluar 20X/0.5 NA air, Plan-Neofluar 40X/1.3 NA oil, and a Plan-Apochromat 63X/1.4 NA oil objectives are available. The microscope has a 3i Vector TIRF illumination module with a 100X objective and Andor DU 897 EMCCD for surface specific fluorescence imaging of samples with evanescent wave excitation, penetration depth of ~100 nm n the Z direction, using the 488 and 561 lasers. Imaging Modes: DIC, Transmitted Light, Epi-Fluorescence, Confocal Fluorescence and FRET. An OKO Lab enviromental enclosure is on the microscope for temperature, gas (CO2, O2 and air/N2), and humidity control during experiments.


NIKON TOTAL INTERNAL REFLECTION FLUORESCENCE (TIRF) MICROSCOPE:

The Ti-E is equipped with a perfect focus motorized nosepiece, an additional emission filter wheel, Nikon filter blocks (DAPI, GFP, CY3 and CY5), an Intensilight System M fiber illuminator, a CFI APO 60x Oil TIRF objective (NA=1.49), and a CFI APO 100x Oil TIRF objective (NA = 1.49).  Imaging Modes: Epi-Fluorescence with a Nikon DS-Fi1 U2 color CCD and Spectral Detector.


 

SCANNING ELECTRON MICROSCOPE (SEM):

The FEI Inspect S SEM is equipped with a tungsten filament, secondary electron detector for standard imaging, a back scattered electron detector, Thermo Noran System Six X-ray microanalysis system (EDS), and a J.C. Nabity Nanometer Pattern Generation Sytem (NPGS) for electron beam patterning and lithography. The SEM will be capable of patterning 80 nm or less line widths. The EDS system provides chemical elemental composition of samples. Additionally the SEM can be operated in environmental mode with variable pressures ranging from 0.6 Torr to 0.08 Torr. Image digital resolution up to 4096 x 3536. Imaging Modes: Secondary Electron Imaging, Back Scattered Electron Imaging, Low Vacuum Imaging, Energy-Dispersive X-ray Spectroscopy (EDS), and J.C. Nabity E-beam Lithography.  


Thermo Fisher Scientific Nicolet IS50R FT-IR Spectrometer:

FT-IR Spectrometer for continuous scan, step-scan and nanosecond time resolved measurements.  Instrument includes a Polaris dual source (27,000 – 15 cm-1), a KBr beamsplitter (7,800 – 350 cm-1), a DTGS detector (12,500 – 350 cm-1), and a liquid nitrogen cooled high sensitivity MCT-A detector (11,700 – 600 cm-1).  The system has an additional TRS high speed data acquisition kit with a TRS MCT-A detector for Step Scan measurements.  A Pike VeeMaxIII variable angle specular refection accessory with CaF ATR crystal, thin-film reflectance, and spectroelectrical chemical cells is available.  A Spectra-Tech Thunderdome diamond crystal ATR accessory is available for thin-film and powder spectroscopy.


Custom-built Potential Modulated-Attenuated Total Reflectance Spectrometer (PM-ATR):

PM-ATR spectrometer for absorbance and electron transfer studies in sub-monolayer thin films on a waveguide platform.  Components consist of an arc lamp source is fiber coupled to a waveguide platform, Newport MS260i spectrograph with a PMT and Andor iDUS420A-OE CCD is used for absorbance detection.  The potential modulated system includes an analog Pine potentiostat, two Stanford Research Systems lock-in-amplifiers and a function generator.